Valence charge fluctuations and Tc retention in Tl1-xPbxSr1+xLa1-xCuO5-y (0.0≤x≤0.5) system

被引：1

作者：

Gopinath, CS ^{[1
]}

Rajendran, M

Varadaraju, UV

Subramanian, S

机构：

[1] Indian Inst Technol, Reg Sophisticated Instrumentat Ctr, Madras 600036, Tamil Nadu, India

[2] Indian Inst Technol, Math Sci Res Ctr, Madras 600036, Tamil Nadu, India

来源：

JOURNAL OF SUPERCONDUCTIVITY | 1998年 / 11卷 / 01期

关键词：

XPS; cuprate superconductor; valence fluctuations; T-c retention;

D O I：

10.1023/A:1022639525484

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Structural and x-ray photoelectron spectroscopy (XPS) studies of the Tl1-xPbxSr1+xLa1-xCuO5-y (0.0 less than or equal to x less than or equal to 0.5) system have been carried out. The unit cell parameters increase with x. Irrespective of x the T-c is retained in this series and the optimum hole concentration (n(h)) is maintained for x less than or equal to 0.5. An increase in Tl 4f and O 1s binding energy with x suggests a reduction in their oxidation state. Origin of holes is discussed in terms of charge transfer between Tl, Pb and CuO2 layers.

引用

页码：139 / 140

页数：2

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