Measurement of electron/hole mobility in organic/polymeric thin films using modified time-of-flight apparatus

We report, using modified time-of-flight (TOF) apparatus, the measurement of the drift mobility of electrons/holes in thin films of vapor-deposited tris(8-hydroxyquinolinolato)aluminum (Alq(3)) and spin-cast poly (N-vinylcarbazole) (PVK) based on silicon. Drift mobilities of both carriers are strongly electric field and temperature dependent. At room temperature and an electric field of 2 x 10(5) Vcm(-1), the effective mobilities of electron and hole are 1 x 10(-5) and 7.14 x 10(-6) cm(2) V-1 s(-1), respectively, in a 200 nm thick samples corresponding to the two materials. (C) 1997 Elsevier Science S.A.