TEM investigation on stress contrast and interfaces of contacting particles

被引：10

作者：

Yao, YM ^{[1
]}

Thölén, A ^{[1
]}

机构：

[1] Chalmers Univ Technol, S-41296 Gothenburg, Sweden

来源：

MATERIALS CHARACTERIZATION | 2000年 / 44卷 / 4-5期

关键词：

D O I：

10.1016/S1044-5803(99)00071-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An investigation on nanoparticle contacting using convergent beam electron diffraction (CBED) and high-resolution electron microscopy (HREM) is reported. Cobalt particles (5-200nm) from a solution-treated Cu-2(w/o)Co alloy were extracted and allowed to contact without pressure. The contacting stress field due to adhesion was clearly observed, and the stress field had a dipole character. Free particles were observed to contact along low-index zone axes and with specific orientation relationships. Fourier transformation of the HREM micrographs revealed a highly distorted area along the contacting boundary containing dislocations. Electron-diffraction contrast from the stress fields between contacting particles was simulated, and agreed well with the experiments. (C) Elsevier Science Inc., 2000. All rights reserved.

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页码：441 / 452

页数：12

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