STRUCTURE AND THERMAL-STABILITY OF NANOCRYSTALLINE SILVER STUDIED BY TRANSMISSION ELECTRON-MICROSCOPY AND POSITRON-ANNIHILATION SPECTROSCOPY

被引:27
作者
KIZUKA, T
NAKAGAMI, Y
OHATA, T
KANAZAWA, I
ICHINOSE, H
MURAKAMI, H
ISHIDA, Y
机构
[1] UNIV TOKYO,INST IND SCI,MINATO KU,TOKYO 106,JAPAN
[2] TOKYO METROPOLITAN IND TECHNOL CTR,KITA KU,TOKYO 115,JAPAN
[3] TOKYO GAKUGEI UNIV,DEPT PHYS,KOGANEI,TOKYO 184,JAPAN
来源
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1994年 / 69卷 / 03期
关键词
D O I
10.1080/01418619408242229
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Positron annihilation spectroscopy was carried out on nanocrystalline silver. Both lifetime and Doppler broadening were measured. High-resolution electron microscopy observations were also performed. Diffuse vacancy clusters, the sizes of which correspond to two to four vacancies, and voids of 1-5 nm diameter, were found to reduce the average atomic density of the grain boundary. Some grains grew to a diameter larger than about 70 nm during annealing the specimen from 50 to 100-degrees-C. A large fraction of the diffuse vacancy clusters and voids in the boundaries remained after annealing at 400-degrees-C. They were stabilized during annealing probably by gaseous atoms.
引用
收藏
页码:551 / 563
页数:13
相关论文
共 30 条
[1]   POSITRON DIFFUSION IN METALS [J].
BERGERSEN, B ;
PAJANNE, E ;
KUBICA, P ;
STOTT, MJ ;
HODGES, CH .
SOLID STATE COMMUNICATIONS, 1974, 15 (08) :1377-1380
[2]   NANOCRYSTALLINE MATERIALS [J].
BIRRINGER, R .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1989, 117 :33-43
[3]   STRUCTURAL CHARACTERIZATION OF NANOMETER-SIZED CRYSTALLINE PD BY X-RAY-DIFFRACTION TECHNIQUES [J].
FITZSIMMONS, MR ;
EASTMAN, JA ;
MULLERSTACH, M ;
WALLNER, G .
PHYSICAL REVIEW B, 1991, 44 (06) :2452-2460
[4]   NANOCRYSTALLINE MATERIALS [J].
BIRRINGER, R .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1989, 117 :33-43
[5]  
HASEGAWA M, 1988, POSITRON ANNIHILATIO, P260
[6]   EFFECT OF MICROVOID SIZE ON POSITRON-ANNIHILATION CHARACTERISTICS AND RESIDUAL RESISTIVITY IN METALS [J].
HAUTOJARVI, P ;
HEINIO, J ;
MANNINEN, M ;
NIEMINEN, R .
PHILOSOPHICAL MAGAZINE, 1977, 35 (04) :973-981
[7]  
HORVATH J, 1987, SOLID STATE COMMUN, V62, P391
[8]   OBSERVATION OF [110] TILT BOUNDARY STRUCTURES IN GOLD BY HIGH-RESOLUTION HVEM [J].
ICHINOSE, H ;
ISHIDA, Y .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (05) :1253-1264
[9]  
ISHINOSE H, 1985, 4TH P JAP I MET I S, P253
[10]   POSITRON-ANNIHILATION IN HELIUM-DECORATED AND KRYPTON-DECORATED MICROVOIDS IN FCC METALS [J].
JENA, P ;
RAO, BK .
PHYSICAL REVIEW B, 1985, 31 (09) :5634-5641