Reactivity of heteropolyanions toward GaAs compound

被引:5
作者
Rothschild, A [1 ]
Quennoy, A [1 ]
Etcheberry, A [1 ]
Debiemme-Chouvy, C [1 ]
机构
[1] Univ Versailles, IREM, UMR CNRS, F-78000 Versailles, France
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2000年 / 18卷 / 05期
关键词
D O I
10.1116/1.1289539
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We studied the reactivity of GaAs in;contact with acidic solutions of, respectively, four heteropolyanions (HPAs): SiW12O404-, SiMo12O404-, PW12O403-, and P2W18O626-; The results obtained by both x-ray photoelectron spectroscopy and etching rate and absorbance measurements showed that GaAs dipped into such solutions undergoes an oxidation/dissolution process while the HPAs are reduced. Indeed, after each immersion of GaAs into an heteropolyanionic solution, a deposit, which consists of As-0 atoms with either partially reduced HPA or WO3 is observed. This study has given us the opportunity to determine the reactions which occur at the GaAs/''HPA solution'' interface and to point out the importance of the semiconductor energy-band position with respect to the first redox potential of the HPA. Knowledge of the semiconductor/HPA energetic dia,sram allows one to predict the behavior of HPA species toward semiconductors. (C) 2000 American Vacuum Society. [S0734-2101(00)07805-2].
引用
收藏
页码:2441 / 2447
页数:7
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