AFM studies of polypyrrole film surface morphology - I. The influence of film thickness and dopant nature

被引：102

作者：

Silk, T ^{[1
]}

Hong, Q

Tamm, J

Compton, RG

机构：

[1] Tartu State Univ, Inst Phys Chem, EE-2400 Tartu, Estonia

[2] Univ Oxford, Phys & Theoret Chem Lab, Oxford OX1 3QZ, England

来源：

SYNTHETIC METALS | 1998年 / 93卷 / 01期

关键词：

polypyrrole; atomic force microscopy; surface morphology; dopant influence; film thickness;

D O I：

10.1016/S0379-6779(98)80131-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this paper the surface morphology of electrogenerated polypyrrole films of various thicknesses and dopant anions (chloride, sulfate, perchlorate and dodecylsulfate) as studied by atomic force microscopy under ex situ conditions is reported. The roughness characteristics of the film surface are determined and discussed. (C) 1998 Elsevier Science S.A.

引用

页码：59 / 64

页数：6

共 36 条

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