Scanning near-field magneto-optic microscopy using illuminated fiber tips

被引:22
作者
Eggers, G
Rosenberger, A
Held, N
Münnemann, A
Güntherodt, G
Fumagalli, P
机构
[1] Rhein Westfal TH Aachen, Inst Phys 2, D-52056 Aachen, Germany
[2] Tech Univ Braunschweig, Inst Halbleiterphys & Opt, D-38106 Braunschweig, Germany
关键词
near-field optics; scanning near-field optical microscope (SNOM; NSOM); magneto-optics; thin magnetic films;
D O I
10.1016/S0304-3991(97)00099-5
中图分类号
TH742 [显微镜];
学科分类号
摘要
By the implementation of a polarization-sensitive detector, a scanning near-field optical microscope (SNOM) can detect local magneto-optic effects with a high lateral resolution. The microscope used for the work presented in this article employs an aluminum-coated fiber tip as a sub-lambda light source. Because such sources show a very poor quality of polarization, a sophisticated detector setup is necessary to eliminate the effects of the unpolarized background signal. As both the light transmitted through the sample or reflected from the sample surface can be detected, the Kerr and Faraday effect can be observed. Images were taken in transmission made from thin iron-garnet films and in reflection mode from MnBiAl multilayers. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:249 / 256
页数:8
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