Calibration of a pH sensitive buried channel silicon-on-insulator MOSFET for sensor applications

被引:15
作者
Ashcroft, B
Takulapalli, B
Yang, J
Laws, GM
Zhang, HQ
Tao, NJ
Lindsay, S
Gust, D
Thornton, TJ
机构
[1] Arizona State Univ, Ctr Solid State Elect Res, Tempe, AZ 85287 USA
[2] Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA
[3] Arizona State Univ, Dept Elect Engn, Tempe, AZ 85287 USA
[4] Arizona State Univ, Dept Chem & Biochem, Tempe, AZ 85287 USA
来源
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2004年 / 241卷 / 10期
关键词
D O I
10.1002/pssb.200404936
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The threshold voltage characteristics of a buried channel silicon-on-insulator MOSFET is examined in solutions of varying acidity. Experiments utilizing an integrated micro-fluidic channel exhibit a variation in threshold voltage that appears approximately linear with pH in the range from pH 4 to pH 7, with a sensitivity of similar to1 V per pH unit. Charge configuration changes in the vicinity of the MOSFET inversion layer due to protonation/deprotonation of the device surface is proposed as an explanation for the observed shifts in threshold voltage. When the pH range is expanded we observe a non-linear relationship between pH and the threshold voltage of the device, this behavior is explained in terms of deprotonation of the different species of the native oxide surface, Numerical simulations of the MOSFET demonstrate that the threshold voltage sensitivity corresponds to an additional surface positive fixed charge density of similar to 1 x 10(10) cm(-2) for each pH unit. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码:2291 / 2296
页数:6
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