Thermal stability of crystalline thin films

被引：115

作者：

Jiang, Q ^{[1
]}

Tong, HY

Hsu, DT

Okuyama, K

Shi, FG

机构：

[1] Jilin Univ Technol, Dept Mat Sci & Engn, Changchun 130025, Peoples R China

[2] Hiroshima Univ, Fac Engn, Higashihiroshima 739, Japan

[3] Univ Calif Irvine, Sch Engn, Irvine, CA 92697 USA

来源：

THIN SOLID FILMS | 1998年 / 312卷 / 1-2期

关键词：

lead; indium; tin; iron;

D O I：

10.1016/S0040-6090(97)00732-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A simple model, free of any adjustable parameter, is introduced for the size-dependent melting of crystalline thin films. It predicts that the melting temperature of a crystalline thin film decreases as its thickness decreases. The prediction is supported by the available experimental results on Pb, In, Sn and Fe thin films. (C) 1998 Elsevier Science S.A.

引用

页码：357 / 361

页数：5

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