The statistical kinematical theory of X-ray diffraction as applied to reciprocal-space mapping

被引:40
作者
Nesterets, YI
Punegov, VI
机构
[1] Syktyvkar State Univ, Dept Theoret & Comp Phys, Syktyvkar 167001, Russia
[2] Syktyvkar State Univ, Dept Solid State Phys, Syktyvkar 167001, Russia
来源
ACTA CRYSTALLOGRAPHICA SECTION A | 2000年 / 56卷
关键词
D O I
10.1107/S010876730000996X
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The statistical kinematical X-ray diffraction theory is developed to describe reciprocal-space maps (RSMs) from deformed crystals with defects of the structure. The general solutions for coherent and diffuse components of the scattered intensity in reciprocal space are derived. As an example, the explicit expressions for intensity distributions in the case of spherical defects and of a mosaic crystal were obtained. The theory takes into account the instrumental function of the triple-crystal diffractometer and can therefore be used for experimental data analysis.
引用
收藏
页码:540 / 548
页数:9
相关论文
共 23 条
[1]  
Bushuev V. A., 1989, Soviet Physics - Crystallography, V34, P163
[2]   High-resolution x-ray diffraction from multilayered self-assembled Ge dots [J].
Darhuber, AA ;
Schittenhelm, P ;
Holy, V ;
Stangl, J ;
Bauer, G ;
Abstreiter, G .
PHYSICAL REVIEW B, 1997, 55 (23) :15652-15663
[3]   The reflexion of X-rays from imperfect crystals [J].
Darwin, CG .
PHILOSOPHICAL MAGAZINE, 1922, 43 (257) :800-829
[4]   Influence of long-range lateral ordering in structures with quantum dots on the spatial distribution of diffracted X-ray radiation [J].
Faleev, N ;
Pavlov, K ;
Tabuchi, M ;
Takeda, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (2A) :818-821
[5]   THE ROLE OF DIFFUSE-SCATTERING ON MICRODEFECTS IN THE PRECISE LATTICE-PARAMETER MEASUREMENT [J].
HOLY, V ;
HARTWIG, J .
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1988, 145 (02) :363-372
[6]   ELASTIC STRAINS IN GAAS/ALAS QUANTUM DOTS STUDIED BY HIGH-RESOLUTION X-RAY-DIFFRACTION [J].
HOLY, V ;
DARHUBER, AA ;
BAUER, G ;
WANG, PD ;
SONG, YP ;
TORRES, CMS ;
HOLLAND, MC .
PHYSICAL REVIEW B, 1995, 52 (11) :8348-8357
[7]   THE COHERENCE DESCRIPTION OF THE DYNAMICAL X-RAY-DIFFRACTION FROM RANDOMLY DISORDERED CRYSTALS .2. SOME NUMERICAL RESULTS [J].
HOLY, V .
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1982, 112 (01) :161-169
[8]   X-RAY TRIPLE-CRYSTAL DIFFRACTOMETRY OF DEFECTS IN EPITAXIAL LAYERS [J].
HOLY, V ;
WOLF, K ;
KASTNER, M ;
STANZL, H ;
GEBHARDT, W .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1994, 27 :551-557
[9]   SEPARATE MEASUREMENTS OF DYNAMICAL AND KINEMATICAL X-RAY DIFFRACTIONS FROM SILICON-CRYSTALS WITH A TRIPLE CRYSTAL DIFFRACTOMETER [J].
IIDA, A ;
KOHRA, K .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 51 (02) :533-542
[10]   X-ray diffraction peaks due to misfit dislocations in heteroepitaxial structures [J].
Kaganer, VM ;
Kohler, R ;
Schmidbauer, M ;
Opitz, R ;
Jenichen, B .
PHYSICAL REVIEW B, 1997, 55 (03) :1793-1810