Hydrogen storage and structure variation in Mg/Pd multi-layer film

被引:19
作者
Ye, S. Y. [1 ,2 ]
Chan, S. L. I. [2 ]
Ouyang, L. Z. [1 ]
Zhu, M. [1 ]
机构
[1] S China Univ Technol, Sch Mat Sci & Engn, Guangzhou 510640, Guangdong, Peoples R China
[2] Univ New S Wales, Sch Mat Sci & Engn, Sydney, NSW 2052, Australia
关键词
Hydrogen storage; Sputtering; Magnesium; Multi-layer thin films; Interfacial free energy; MG THIN-FILMS; MAGNESIUM HYDRIDE; DESORPTION; ABSORPTION;
D O I
10.1016/j.jallcom.2010.05.150
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The hydrogen storage properties of the as-deposited Mg/Pd multi-layer films by magnetron sputtering have been studied in this work. X-ray diffraction (XRD), scanning electron microscopy (SEM) and transmission electron microscopy (TEM) analysis revealed that the Mg/Pd multi-layer film was composed of fine-crystalline Pd layers and columnar crystalline Mg layers. The cycle hydrogenation and dehydrogenation of the film were performed at different temperatures (305 K, 373 K and 323 K). The film absorbed and desorbed about 2.6 wt.% hydrogen at a low temperature of 373 K, which is close to the theoretical hydrogen absorption value of 2.8 wt.% for Mg6Pd. When lowering to 323 K, the film can still absorb-desorb about 2.5 wt.% of hydrogen. During hydrogenation-dehydrogenation, Mg6Pd formed first, followed by MgH2 and Mg5Pd2. After desorption there were only Mg6Pd and Mg5Pd2 phases identified in the film, showing complete dehydrogenation of the thin film at 323K. It is believed that additional interfacial free energy in the thin film and the catalytic effect of Pd, can be accounted for the low temperature hydrogen absorption-desorption cycles. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:493 / 497
页数:5
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