Characteristics of Pb[(Zn1/3Nb2/3)0.955Ti0.045]O3 single crystals versus growth method

被引:16
作者
Benayad, A [1 ]
Kobor, D [1 ]
Lebrun, L [1 ]
Guiffard, B [1 ]
Guyomar, D [1 ]
机构
[1] Inst Natl Sci Appl, LGEF, F-69621 Villeurbanne, France
关键词
single crystal growth; X-ray diffraction; perovskites; ferro-electric materials; piezoelectric materials;
D O I
10.1016/j.jcrysgro.2004.06.017
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Relaxor-based piezoelectric 0.955Pb(Zn1/3Nb2/3)O-3-0.045PbTiO(3) (PZN-4.5PT) single crystals were grown by two methods: the flux method and the modified Bridgman method from a flux of Pb3O4 in sealed platinum crucibles at about 1200degreesC with a cooling rate of 0.8-1degreesC/h for flux method and a translation rate of 0.4-0.6 mm/h for MB method. A dedicated oven suitable for two methods has been specially built. The ratio PZN-PT/Flux was 40/60 mol % for the two methods. In this paper, some characteristics of the crystals obtained by flux and modified Bridgmann method such as the lattice parameters and the melting point are compared. The dielectric properties of the grown PZN-4.5PT crystals have been measured as a function of temperature at various frequencies. The phase transition from the tetragonal P4 mm to cubic phase takes place at 166 degreesC for the crystals grown by Bridgmann modified method and Flux method. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:137 / 144
页数:8
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