Sub-micron LIGA process for movable microstructures

被引:9
作者
Borner, MW [1 ]
Kohl, M [1 ]
Pantenburg, FJ [1 ]
Bacher, W [1 ]
Hein, H [1 ]
Schomburg, WK [1 ]
机构
[1] FORSCHUNGSZENTRUM KARLSRUHE GMBH,INST MIKROSTRUKTURTECH,D-76021 KARLSRUHE,GERMANY
关键词
D O I
10.1016/0167-9317(95)00296-0
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The feasibility of making movable metal microstructures with lateral dimensions in the sub-micron range and aspect ratios of up to 100 was demonstrated. These structures were manufactured by X-ray lithography in resists approximately some ten micrometers high and with electroplated nickel. The small resist height, compared to deep X-ray lithography, allowed softer X-rays and lower absorbers on the mask to be used. Therefore, no intermediate masks are needed and shorter beam times are possible. The small overall dimensions of devices with sub-micron dimensions even with very high aspect ratios allow a much larger number of devices to be arranged on a wafer. This opens up a way to cost effective manufacturing of movable microstructures on top of electronic circuits when the performance of the device is determined by the aspect ratio, not by its overall size.
引用
收藏
页码:505 / 508
页数:4
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