Comparison of test images obtained from various configurations of scanning near-field optical microscopes

被引:19
作者
Bainier, C [1 ]
Vannier, C
Courjon, D
Rivoal, JC
Ducourtieux, S
De Wilde, Y
Aigouy, L
Formanek, F
Belliard, L
Siry, P
Perrin, B
机构
[1] CNRS 1860, Grp Rech Opt Champ Proche, F-25030 Besancon, France
[2] CNRS, Lab Opt, Unite Mixte Rech 6603, F-25030 Besancon, France
[3] Lab Opt Phys, Unite Propre Rech A0005, F-75231 Paris 05, France
[4] Univ Paris 06, Ecole Super Phys & Chim Ind, F-75231 Paris 05, France
[5] Univ Paris 06, Lab Milieux Desordonnes & Heterogenes, Unite Mixte Rech 7603, F-75252 Paris 05, France
关键词
D O I
10.1364/AO.42.000691
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The characteristics of a few experimental near-field optical microscopes, located in different laboratories, have been compared on the basis of their ability to image a well-defined submicrometer test, object. (C) 2003 Optical Society of America.
引用
收藏
页码:691 / 700
页数:10
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