Comparison of test images obtained from various configurations of scanning near-field optical microscopes

被引：19

作者：

Bainier, C ^{[1
]}

Vannier, C

Courjon, D

Rivoal, JC

Ducourtieux, S

De Wilde, Y

Aigouy, L

Formanek, F

Belliard, L

Siry, P

Perrin, B

机构：

[1] CNRS 1860, Grp Rech Opt Champ Proche, F-25030 Besancon, France

[2] CNRS, Lab Opt, Unite Mixte Rech 6603, F-25030 Besancon, France

[3] Lab Opt Phys, Unite Propre Rech A0005, F-75231 Paris 05, France

[4] Univ Paris 06, Ecole Super Phys & Chim Ind, F-75231 Paris 05, France

[5] Univ Paris 06, Lab Milieux Desordonnes & Heterogenes, Unite Mixte Rech 7603, F-75252 Paris 05, France

来源：

APPLIED OPTICS | 2003年 / 42卷 / 04期

关键词：

D O I：

10.1364/AO.42.000691

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The characteristics of a few experimental near-field optical microscopes, located in different laboratories, have been compared on the basis of their ability to image a well-defined submicrometer test, object. (C) 2003 Optical Society of America.

引用

页码：691 / 700

页数：10