Strong and stable ultraviolet luminescence in porous silicon in situ passivated by manganese

被引：15

作者：

Chen, QW ^{[1
]}

Zhu, DL ^{[1
]}

Zhang, YH ^{[1
]}

机构：

[1] Univ Sci & Technol China, Struct Res Lab, Anhua 230026, Peoples R China

来源：

APPLIED PHYSICS LETTERS | 2000年 / 77卷 / 06期

关键词：

D O I：

10.1063/1.1306396

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A strong and stable ultraviolet photoluminescence (PL) band (370 nm) together with a red luminescence band around 670 nm with a 730 nm shoulder were observed in Mn-passivated porous silicon (PS) prepared by the hydrothermal technique. The surface structure is examined by Fourier infrared and x-ray photoelectron spectroscopy analysis. The 670 nm band was confirmed to be the usually observed PL band in PS, and the appearance of the 370 nm band and 730 nm shoulder peak was interpreted based on surface structure characterization and spectroscopy measurements. (C) 2000 American Institute of Physics. [S0003-6951(00)04230-3].

引用

页码：854 / 856

页数：3

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