Seed layer characterization for PtMn bottom spin-filter spin valves

被引:21
作者
Lee, CL [1 ]
Devasahayam, A [1 ]
Mao, M [1 ]
Kools, J [1 ]
Cox, P [1 ]
Masaryk, K [1 ]
Mahenthiran, D [1 ]
Munson, J [1 ]
机构
[1] Veeco Instruments Inc, Rochester, NY 14606 USA
关键词
D O I
10.1063/1.1558097
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effect of seed layers on the giant magnetoresistance (GMR) response of bottom spin-filter spin valves (SFSVs) of the structure (seed layer)/PtMn/CoFe/Cu/CoFe/NiFe/Cu/Ta have been studied in detail. Four types of seed layers, NiFeCr, Ta/NiFeCr, NiFeCr/NiFe, and Ta/NiFe were used. The GMR response has been found to be very sensitive to the type and the thickness of the seed layers, which determine the crystallographic quality of the films and the degree of the fcc to fct phase transformation of the PtMn crystals in the films. Among the four, Ta/NiFeCr and NiFeCr/NiFe seed layers give the optimal GMR performance at a NiFeCr layer thickness of about 40-45 Angstrom. (C) 2003 American Institute of Physics.
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收藏
页码:8406 / 8408
页数:3
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