The effect of seed size on the growth of silicalite-1 films on gold surfaces

被引:31
作者
Engström, V
Mihailova, B
Hedlund, J
Holmgren, A
Sterte, J [1 ]
机构
[1] Lulea Univ Technol, Dept Chem & Met Engn, Div Chem Technol, S-97187 Lulea, Sweden
[2] Bulgarian Acad Sci, Cent Lab Mineral & Crystallog, Sofia 1000, Bulgaria
关键词
silicalite-1; thin films; gold surface; defects; infrared spectroscopy;
D O I
10.1016/S1387-1811(99)00299-1
中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
Silicalite-1 films grown on gold surfaces seeded with colloidal crystals with a size of 60, 165 and 320 nm were investigated by reflection-absorption infrared spectroscopy, scanning electron microscopy and X-ray diffraction in order to follow up the formation of nano-scale defects and to determine the optimal synthesis conditions for preparation of silicalite-1 films with a low concentration of defects. Using 60-nm-sized colloidal crystals, the seeding method was capable of producing silicalite-1 films with low concentrations of defects and with thicknesses ranging from 100 to 300 nm, which are predominantly oriented with the a-axis perpendicular to the surface. Hydrothermal treatment times of the 60-nm-seeded surfaces longer than 36 h as well as the seeding with 165 or 320 nm colloidal crystals substantially enhanced the formation of defects in the films. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:51 / 60
页数:10
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