Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation

被引:127
作者
Stark, RW [1 ]
Heckl, WM [1 ]
机构
[1] Univ Munich, Inst Kristallog & Angew Mineral, D-80333 Munich, Germany
关键词
atomic force microscopy; computer simulations;
D O I
10.1016/S0039-6028(00)00378-2
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The periodic impact force induced by the tip-sample contact in tapping mode atomic force microscopy (TM-AFM) gives rise to anharmonic oscillations of the sensing cantilever. These anharmonic signals can be understood with a model which goes beyond the common Hookian approximation: the cantilever is described as a multiple degree of freedom system. A theoretical analysis of the anharmonic signals in the light of the extended model shows that these signals contain information on the elastic properties of the specimen surface. In Fourier transformed operation mode of TM-AFM the anharmonic oscillations are analyzed in the frequency domain. This allows for the reconstruction of characteristics of the tip-sample force, like contact time and maximum contact force. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:219 / 228
页数:10
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