Experimental and theoretical characterization of the surface acoustic wave propagation properties of GaN epitaxial layers on c-plane sapphire

被引:19
作者
Choi, KF [1 ]
Kim, HJ
Chung, SJ
Kim, JY
Lee, TK
Kim, YJ
机构
[1] Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea
[2] Natl Inst Stand & Technol, Film Characterizat & Properties Grp Ceram Div, Gaithersburg, MD 20899 USA
[3] Seoul Natl Univ Techol, Dept Mat Sci & Engn, Seoul 131743, South Korea
[4] Kyonggi Univ, Dept Mat Sci & Engn, Suwon 442760, South Korea
关键词
D O I
10.1557/JMR.2003.0158
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Surface acoustic wave (SAW) propagation properties of gallium nitride (GaN) epitaxial layers on sapphire were theoretically and experimentally characterized. GaN thin films were grown on a c-plane sapphire substrate using a metalorganic chemical vapor deposition system. The experimental characterization of SAW propagation properties was performed with a linear array of interdigital transducer structures, while SAW velocities were calculated by matrix methods. Experimentally, we found pseudo-SAW and high-velocity pseudo-SAW modes in the GaN/sapphire structure, which had a good agreement with calculated velocities.
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收藏
页码:1157 / 1161
页数:5
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