"Charge Leakage" at LaMnO3/SrTiO3 Interfaces

被引：115

作者：

Garcia-Barriocanal, Javier ^{[1
,3
]}

Bruno, Flavio Y. ^{[1
]}

Rivera-Calzada, Alberto ^{[1
]}

Sefrioui, Zouhair ^{[1
]}

Nemes, Norbert M. ^{[1
]}

Garcia-Hernandez, Mar ^{[2
]}

Rubio-Zuazo, Juan ^{[3
]}

Castro, German R. ^{[3
]}

Varela, Maria ^{[4
]}

Pennycook, Stephen J. ^{[4
]}

Leon, Carlos ^{[1
]}

Santamaria, Jacobo ^{[1
]}

机构：

[1] Univ Complutense Madrid, Dpto Fis Aplicada 3, GFMC, E-28040 Madrid, Spain

[2] CSIC, Inst Ciencia Mat Madrid, E-28049 Madrid, Spain

[3] European Synchrotron Radiat Facil, SpLine Spanish CRG Beamline, F-38043 Grenoble, France

[4] Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USA

来源：

ADVANCED MATERIALS | 2010年 / 22卷 / 05期

关键词：

SUPERLATTICES; HETEROSTRUCTURES; LAMNO3+DELTA; MULTILAYERS; OXIDES;

D O I：

10.1002/adma.200902263

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Direct evidence for charge leakage at the interface of epitaxial SrTiO3/LaMnO3 superlattices with atomically sharp interfaces is provided. The direction of charge leakage can be reversed by changing the LMO/STO thickness ratio. This result will be important for the understanding of some of the reported limitations of oxide devices involving manganite/titanate interfaces.

引用

页码：627 / +

页数：7

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