Structural characterization of vacuum evaporated ZnSe thin films

被引：136

作者：

Kalita, PKR ^{[1
]}

Sarma, BK ^{[1
]}

Das, HL ^{[1
]}

机构：

[1] Gauhati Univ, Dept Phys, Guwahati 781014, India

来源：

BULLETIN OF MATERIALS SCIENCE | 2000年 / 23卷 / 04期

关键词：

ZnSe thin films; X-ray diffraction; average internal stress; microstrain; dislocation density;

D O I：

10.1007/BF02720089

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Thermally evaporated ZnSe thin films deposited on glass substrates within substrate temperatures (T-s) at 303 K-623 K are of polycrystalline nature having f.c.c. zincblende structure. The most preferential orientation is along [111] direction for all deposited films together with other abundant planes [220] and [311]. The lattice parameter, grain size, average internal stress, microstrain, dislocation density and degree of preferred orientation in the film are calculated and correlated with T-s.

引用

页码：313 / 317

页数：5

共 16 条

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