Photomodulated thermoreflectance detection of hydrogen gas using optically thin palladium film on silicon oxide

被引:2
作者
Kalli, K
Othonos, A
Christofides, C
Lundstrom, I
机构
[1] Univ Cyprus, Fac Pure & Appl Sci, Dept Nat Sci, CY-1678 Nicosia, Cyprus
[2] Linkoping Univ, Dept Phys & Measurement Technol, S-58183 Linkoping, Sweden
关键词
D O I
10.1063/1.1148787
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The sensitivity various thicknesses of optically thin film palladium layers evaporated onto silicon oxide substrate is investigated in the presence of a hydrogen/air atmosphere at room temperature. The magnitude of the resulting reflectivity change is measured using an excite-probe technique, through laser excited photothermal modulation of a probe beam. This allows for the recovery of information from both the amplitude and phase channels of the hydrogen sensor output. Data indicates that concentrations of 0.1% hydrogen in the presence of a balanced air mixture and room temperature may be measured with an 8 nm palladium film. The presence of inhomogeneities the palladium layers leads to anomalous behavior. (C) 1998 American Institute of Physics.
引用
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页码:1505 / 1511
页数:7
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