ON THE DETERMINATION OF SOURCE AND DRAIN SERIES RESISTANCES OF MESFETS

被引:18
作者
CHAUDHURI, S [1 ]
DAS, MB [1 ]
机构
[1] USAF,WRIGHT AERONAUT LABS,AADR,ELECTR RES BRANCH,WRIGHT PATTERSON AFB,OH 45433
关键词
D O I
10.1109/EDL.1984.25904
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:244 / 246
页数:3
相关论文
共 3 条
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    FUKUI, H
    [J]. BELL SYSTEM TECHNICAL JOURNAL, 1979, 58 (03): : 771 - 797
  • [2] A NEW INTERPRETATION OF END RESISTANCE MEASUREMENTS
    LEE, K
    SHUR, M
    LEE, KW
    VU, T
    ROBERTS, P
    HELIX, M
    [J]. IEEE ELECTRON DEVICE LETTERS, 1984, 5 (01) : 5 - 7
  • [3] LIN HC, 1967, INTEGRATED ELECTRONI, P105