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ON THE DETERMINATION OF SOURCE AND DRAIN SERIES RESISTANCES OF MESFETS
被引:18
作者
:
CHAUDHURI, S
论文数:
0
引用数:
0
h-index:
0
机构:
USAF,WRIGHT AERONAUT LABS,AADR,ELECTR RES BRANCH,WRIGHT PATTERSON AFB,OH 45433
USAF,WRIGHT AERONAUT LABS,AADR,ELECTR RES BRANCH,WRIGHT PATTERSON AFB,OH 45433
CHAUDHURI, S
[
1
]
DAS, MB
论文数:
0
引用数:
0
h-index:
0
机构:
USAF,WRIGHT AERONAUT LABS,AADR,ELECTR RES BRANCH,WRIGHT PATTERSON AFB,OH 45433
USAF,WRIGHT AERONAUT LABS,AADR,ELECTR RES BRANCH,WRIGHT PATTERSON AFB,OH 45433
DAS, MB
[
1
]
机构
:
[1]
USAF,WRIGHT AERONAUT LABS,AADR,ELECTR RES BRANCH,WRIGHT PATTERSON AFB,OH 45433
来源
:
IEEE ELECTRON DEVICE LETTERS
|
1984年
/ 5卷
/ 07期
关键词
:
D O I
:
10.1109/EDL.1984.25904
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:244 / 246
页数:3
相关论文
共 3 条
[1]
DETERMINATION OF THE BASIC DEVICE PARAMETERS OF A GAAS-MESFET
FUKUI, H
论文数:
0
引用数:
0
h-index:
0
FUKUI, H
[J].
BELL SYSTEM TECHNICAL JOURNAL,
1979,
58
(03):
: 771
-
797
[2]
A NEW INTERPRETATION OF END RESISTANCE MEASUREMENTS
LEE, K
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC, SYST & RES CTR, MINNEAPOLIS, MN 55413 USA
LEE, K
SHUR, M
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC, SYST & RES CTR, MINNEAPOLIS, MN 55413 USA
SHUR, M
LEE, KW
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC, SYST & RES CTR, MINNEAPOLIS, MN 55413 USA
LEE, KW
VU, T
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC, SYST & RES CTR, MINNEAPOLIS, MN 55413 USA
VU, T
ROBERTS, P
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC, SYST & RES CTR, MINNEAPOLIS, MN 55413 USA
ROBERTS, P
HELIX, M
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC, SYST & RES CTR, MINNEAPOLIS, MN 55413 USA
HELIX, M
[J].
IEEE ELECTRON DEVICE LETTERS,
1984,
5
(01)
: 5
-
7
[3]
LIN HC, 1967, INTEGRATED ELECTRONI, P105
←
1
→
共 3 条
[1]
DETERMINATION OF THE BASIC DEVICE PARAMETERS OF A GAAS-MESFET
FUKUI, H
论文数:
0
引用数:
0
h-index:
0
FUKUI, H
[J].
BELL SYSTEM TECHNICAL JOURNAL,
1979,
58
(03):
: 771
-
797
[2]
A NEW INTERPRETATION OF END RESISTANCE MEASUREMENTS
LEE, K
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC, SYST & RES CTR, MINNEAPOLIS, MN 55413 USA
LEE, K
SHUR, M
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC, SYST & RES CTR, MINNEAPOLIS, MN 55413 USA
SHUR, M
LEE, KW
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC, SYST & RES CTR, MINNEAPOLIS, MN 55413 USA
LEE, KW
VU, T
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC, SYST & RES CTR, MINNEAPOLIS, MN 55413 USA
VU, T
ROBERTS, P
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC, SYST & RES CTR, MINNEAPOLIS, MN 55413 USA
ROBERTS, P
HELIX, M
论文数:
0
引用数:
0
h-index:
0
机构:
HONEYWELL INC, SYST & RES CTR, MINNEAPOLIS, MN 55413 USA
HELIX, M
[J].
IEEE ELECTRON DEVICE LETTERS,
1984,
5
(01)
: 5
-
7
[3]
LIN HC, 1967, INTEGRATED ELECTRONI, P105
←
1
→