Characterization of Pb(Zr,Ti)O-3 thin films obtained by MOD

被引:9
作者
Nieto, E
Fernandez, JF
Moure, C
Duran, P
机构
[1] Electroceramics Department, Instituto de Cerámica y Vidrio (CSIC), Madrid, 28500, Arganda del Rey
关键词
D O I
10.1007/BF00369672
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Pb(Zr,Ti)O-3 thin films were deposited by dip-coating on polycrystalline alumina substrates by using an MOD method. The thickness and homogeneity of the films were measured as a function of dip rates and solution concentration. Heating and cooling schedules determined the main structure of the crystallized films. Rheology measurements and Fourier transform-infrared spectra were carried out to obtain a better knowledge of the solution features. A microstructural development study and some ferroelectric measurements were also carried out.
引用
收藏
页码:6243 / 6248
页数:6
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