SUPER-LATTICE INTERFACE AND LATTICE STRAIN-MEASUREMENT BY ION CHANNELING

被引：38

作者：

CHU, WK ^{[1
]}

PAN, CK ^{[1
]}

CHANG, CA ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

PHYSICAL REVIEW B | 1983年 / 28卷 / 07期

关键词：

D O I：

10.1103/PhysRevB.28.4033

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：4033 / 4036

页数：4

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