CHARACTERIZATION OF TITANIUM NITRIDE FILMS DEPOSITED ONTO SILICON

被引:18
作者
ARMIGLIATO, A [1 ]
CELOTTI, G [1 ]
GARULLI, A [1 ]
GUERRI, S [1 ]
OSTOJA, P [1 ]
ROSA, R [1 ]
MARTINELLI, G [1 ]
机构
[1] UNIV FERRARA,IST FIS,I-44100 FERRARA,ITALY
关键词
D O I
10.1016/0040-6090(82)90158-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:341 / 346
页数:6
相关论文
共 15 条
  • [11] NEKEL A, 1976, J PHYS C SOLID STATE, V9, P579
  • [12] OPTICAL-PROPERTIES OF SUBSTOICHIOMETRIC TINX
    RIVORY, J
    BEHAGHEL, JM
    BERTHIER, S
    LAFAIT, J
    [J]. THIN SOLID FILMS, 1981, 78 (02) : 161 - 165
  • [13] ROSA R, 1980, ROSALBA ELLISSOMETRI
  • [14] OPTICAL-PROPERTIES OF TIN AND ZRN
    SCHLEGEL, A
    WACHTER, P
    NICKL, JJ
    LINGG, H
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1977, 10 (23): : 4889 - 4896
  • [15] INVESTIGATION OF TITANIUM-NITRIDE LAYERS FOR SOLAR-CELL CONTACTS
    VONSEEFELD, H
    CHEUNG, NW
    MAENPAA, M
    NICOLET, MA
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (04) : 873 - 876