NEW TECHNIQUE TO DETECT THE GAAS SEMIINSULATING SURFACE-PROPERTY - CW ELECTROOPTIC PROBING

被引：6

作者：

LO, YH ^{[1
]}

ZHU, ZH ^{[1
]}

PAN, CL ^{[1
]}

WANG, SY ^{[1
]}

WANG, S ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY,ELECTR RES LAB,BERKELEY,CA 94720

来源：

APPLIED PHYSICS LETTERS | 1987年 / 50卷 / 17期

关键词：

D O I：

10.1063/1.97937

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：1125 / 1127

页数：3

相关论文

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