THEORETICAL AND EXPERIMENTAL APPROACH FOR THE CHARACTERIZATION OF SURFACE STRUCTURAL MICROTEXTURE OF INTERMEDIATE THICKNESS LAYERS BY ATTENUATED TOTAL REFLECTION

被引：5

作者：

BELALI, R ^{[1
]}

VIGOUREUX, JM ^{[1
]}

CAMELOT, M ^{[1
]}

机构：

[1] FAC SCI & TECH BESANCON,CNRS,PHYS MOLEC LAB,F-25030 BESANCON,FRANCE

来源：

SPECTROCHIMICA ACTA PART A-MOLECULAR AND BIOMOLECULAR SPECTROSCOPY | 1987年 / 43卷 / 10期

关键词：

D O I：

10.1016/0584-8539(87)80010-7

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：1261 / 1267

页数：7

共 23 条

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