SURFACE STUDIES BY SPECTRAL ANALYSIS OF INTERNALLY REFLECTED INFRARED RADIATION - HYDROGEN ON SILICON

被引：85

作者：

BECKER, GE

GOBELI, GW

机构：

来源：

JOURNAL OF CHEMICAL PHYSICS | 1963年 / 38卷 / 12期

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D O I：

10.1063/1.1733624

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

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页码：2942 / &

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