TEMPERATURE-DEPENDENCE OF THE FREE-EXCITON-EMISSION LINEWIDTH IN HIGH-PURITY INP

被引:4
作者
BENZAQUEN, R
LEONELLI, R
CHARBONNEAU, S
POOLE, PJ
ROTH, AP
机构
[1] UNIV MONTREAL, RECH PHYS & TECHNOL COUCHES MINCES GRP, MONTREAL, PQ H3C 3J7, CANADA
[2] UNIV MONTREAL, DEPT PHYS, MONTREAL, PQ H3C 3J7, CANADA
关键词
D O I
10.1103/PhysRevB.52.R2273
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Temperature-dependent photoluminescence measurements have been performed to study the linewidth of the n=1 free-exciton transition in a high-purity n-type InP epilayer. The spectra reveal that the linewidth of the emission from upper-branch polaritons broadens rapidly when the temperature increases, while that of lower-branch polaritons narrows in the temperature range of 20-30 K. These results, which cannot be explained within the framework of the standard polariton transport model, are well reproduced by a phenomenological model that takes into account polariton scattering by bound excitons, ionized impurities, and phonons.
引用
收藏
页码:R2273 / R2276
页数:4
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