THERMALLY INDUCED STRAINS IN EVAPORATED FILMS

[1] [Anonymous], 1961, XRAY METALLOGRAPHY

[2] INDEX OF REFRACTION AND COEFFICIENTS OF EXPANSION OF OPTICAL GLASSES AT LOW TEMPERATURES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1949, 39 (07) : 600 - 611

[3] The thermal expansion of pure metals copper, gold, aluminum, nickel, and iron [J]. PHYSICAL REVIEW, 1941, 60 (08): : 597 - 605

[4] Nye J. F., 1957, PHYSICAL PROPERTIES

[5] SCHOENING FRL, PRIVATE COMMUNICATIO

[6] X-RAY DIFFRACTOMETER ATTACHMENT FOR DIRECT OBSERVATION OF EVAPORATED THIN FILMS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1963, 34 (07) : 792 - &

[7] STRUCTURE AND ANNEALING BEHAVIOR OF METAL FILMS DEPOSITED ON SUBSTRATES NEAR 80 DEGREES K .I. COPPER FILMS ON GLASS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1965, 2 (01): : 49 - &

[8] 1963, AMERICAN I PHYSICS H, P3

[1] [Anonymous], 1961, XRAY METALLOGRAPHY

[2] INDEX OF REFRACTION AND COEFFICIENTS OF EXPANSION OF OPTICAL GLASSES AT LOW TEMPERATURES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1949, 39 (07) : 600 - 611

[3] The thermal expansion of pure metals copper, gold, aluminum, nickel, and iron [J]. PHYSICAL REVIEW, 1941, 60 (08): : 597 - 605

[4] Nye J. F., 1957, PHYSICAL PROPERTIES

[5] SCHOENING FRL, PRIVATE COMMUNICATIO

[6] X-RAY DIFFRACTOMETER ATTACHMENT FOR DIRECT OBSERVATION OF EVAPORATED THIN FILMS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1963, 34 (07) : 792 - &

[7] STRUCTURE AND ANNEALING BEHAVIOR OF METAL FILMS DEPOSITED ON SUBSTRATES NEAR 80 DEGREES K .I. COPPER FILMS ON GLASS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1965, 2 (01): : 49 - &

[8] 1963, AMERICAN I PHYSICS H, P3