CHARGED DANGLING BONDS - KEY TO ELECTRONIC TRANSPORT, RECOMBINATION AND METASTABILITY IN HYDROGENATED AMORPHOUS-SILICON

被引:9
作者
BRANZ, HM [1 ]
SILVER, M [1 ]
机构
[1] UNIV N CAROLINA, CHAPEL HILL, NC 27599 USA
关键词
D O I
10.1016/0022-3093(89)90675-3
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:639 / 641
页数:3
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