DIFFUSE-SCATTERING MEASUREMENTS WITH SYNCHROTRON RADIATION - INSTRUMENTATION AND TECHNIQUES

被引：10

作者：

MATSUBARA, E

GEORGOPOULOS, P

机构：

[1] NORTHWESTERN UNIV,INST TECHNOL,DEPT MAT SCI & ENGN,EVANSTON,IL 60201

[2] MATRIX,EVANSTOWN,IL 60201

来源：

关键词：

D O I：

10.1107/S0021889885010585

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：377 / 383

页数：7

共 19 条

[1] THE STRUCTURE OF GPI ZONES IN AL-1.7 AT PERCENT CU
AUVRAY, X
GEORGOPOULOS, P
COHEN, JB
[J]. ACTA METALLURGICA, 1981, 29 (06): : 1061 - 1075
[2] BATTERMAN BW, 1980, CHESS6 TECHN MEM
[3] X-RAY MIRROR REFLECTIVITIES FROM 3.8 TO 50 KEV (3.3 TO 0.25A) .1. FLOAT GLASS
BILDERBACK, DH
HUBBARD, S
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 195 (1-2): : 85 - 89
[4] X-RAY MIRROR REFLECTIVITIES FROM 3.8 TO 50 KEV (3.3 TO 0.25 A) .2. PT, SI AND OTHER MATERIALS
BILDERBACK, DH
HUBBARD, S
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 195 (1-2): : 91 - 95
[5] COHEN JB, 1984, MRC S P, V21, P119
[6] GEORGOPOULOS P, 1977, J PHYS PARIS S12, V38, P191
[7] GRAY DE, 1972, AM I PHYSICS HDB
[8] Hoerl A.E., 1959, CHEM ENG PROG, V55, P69
[9] Hoerl A. E., 1962, CHEM ENG PROGR, V58, P54
[10] RIDGE REGRESSION - APPLICATIONS TO NONORTHOGONAL PROBLEMS
HOERL, AE
KENNARD, RW
[J]. TECHNOMETRICS, 1970, 12 (01) : 69 - &