MICROWAVE MEASUREMENT OF THIN-FILM TRANSDUCER COUPLING CONSTANT

被引:14
作者
REEDER, TM
机构
来源
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS | 1967年 / 55卷 / 06期
关键词
D O I
10.1109/PROC.1967.5745
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
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页码:1099 / &
相关论文
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