DIRECT OBSERVATION OF THE MICROMORPHOLOGY OF POLYETHER POLYURETHANES USING HIGH-VOLTAGE ELECTRON-MICROSCOPY

被引:48
作者
LI, C [1 ]
COOPER, SL [1 ]
机构
[1] UNIV WISCONSIN,DEPT CHEM ENGN,MADISON,WI 53706
基金
美国国家科学基金会;
关键词
high voltage electron microscopy (HVEM); microdomain structure; segmented polyether polyurethanes;
D O I
10.1016/0032-3861(90)90339-Z
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
The micromorphology of segmented polyether polyurethanes based on poly(tetramethylene oxide) soft segments and semicrystalline methylene diphenylene diisocyanate and butanediol hard segments was examined using high-voltage electron microscopy (HVEM). Specimens for electron microscopy studies were prepared by thin-film casting and by cryoultramicrotomy of solvent cast or compression moulded bulk samples. Short cylinder or lamellar morphology was observed in the polyether polyurethanes depending on the sample's composition. Microdomain spacings measured from electron microscopy micrographs were compared to previously reported long spacings calculated from small-angle x-ray scattering data. Annealing of polyether polyurethane thin films was found to cause rearrangement of the microdomain structure. © 1990.
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页码:3 / 7
页数:5
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