POLYCRYSTAL SCATTERING TOPOGRAPHY, SCATTERING TOMOGRAPHY AND THEIR PERSPECTIVE FIELDS OF APPLICATION

[1] BARRETT CS, 1966, STRUCTURE METALS, P466

[2] MULTIPLE BRAGG REFLECTION MONOCHROMATORS FOR SYNCHROTRON-X RADIATION [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (10): : 823 - 829

[3] TEXTURE TOPOGRAPHY [J]. KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY, 1979, 14 (03): : 325 - 332

[4] PERSPECTIVE FIELDS OF APPLICATION OF TEXTURE TOPOGRAPHY AND FURTHER DEVELOPMENT OF ITS APPARATUS [J]. KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY, 1980, 15 (07): : 837 - 842

[5] CHALMERS B, 1959, PHYSICAL METALLURGY, P157

[6] CHIKAURA Y, 1982, J APPL CRYST, V15

[7] DOIG P, 1981, J APPL CRYSTALLOGR, V14, P124, DOI 10.1107/S002188988100890X

[8] HORIUCHI T, 1971, 32ND P ANN C APPL PH, P343

[9] AN X-RAY COLOR TV SYSTEM WITH PREFERRED DISPLAY OF SOFT X-RAYS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (02) : 353 - 358

[10] YONEDA Y, 1979, 1979 P PLAN M XRAY I, P85

[1] BARRETT CS, 1966, STRUCTURE METALS, P466

[2] MULTIPLE BRAGG REFLECTION MONOCHROMATORS FOR SYNCHROTRON-X RADIATION [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (10): : 823 - 829

[3] TEXTURE TOPOGRAPHY [J]. KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY, 1979, 14 (03): : 325 - 332

[4] PERSPECTIVE FIELDS OF APPLICATION OF TEXTURE TOPOGRAPHY AND FURTHER DEVELOPMENT OF ITS APPARATUS [J]. KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY, 1980, 15 (07): : 837 - 842

[5] CHALMERS B, 1959, PHYSICAL METALLURGY, P157

[6] CHIKAURA Y, 1982, J APPL CRYST, V15

[7] DOIG P, 1981, J APPL CRYSTALLOGR, V14, P124, DOI 10.1107/S002188988100890X

[8] HORIUCHI T, 1971, 32ND P ANN C APPL PH, P343

[9] AN X-RAY COLOR TV SYSTEM WITH PREFERRED DISPLAY OF SOFT X-RAYS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (02) : 353 - 358

[10] YONEDA Y, 1979, 1979 P PLAN M XRAY I, P85