STRUCTURE-FACTOR PHASE INFORMATION FROM 2-BEAM ELECTRON-DIFFRACTION

[1] Andersen J. U., 1971, Radiation Effects, V7, P25, DOI 10.1080/00337577108232561

[2] DETECTION OF FOREIGN ATOM SITES BY THEIR X-RAY FLUORESCENCE SCATTERING [J]. PHYSICAL REVIEW LETTERS, 1969, 22 (14) : 703 - +

[3] DIRECT DETERMINATION OF X-RAY REFLECTION PHASES [J]. PHYSICAL REVIEW LETTERS, 1982, 48 (03) : 163 - 166

[4] CHERNS D, 1973, Z NATURFORSCH A, VA 28, P565

[5] COSTER D, 1930, Z PHYS, V53, P345

[6] ENHANCED X-RAY EMISSION FROM EXTINCTION CONTOURS IN A SINGLE-CRYSTAL GOLD FILM [J]. PHILOSOPHICAL MAGAZINE, 1962, 7 (84): : 2101 - &

[7] STRUCTURE INFORMATION FROM ANOMALOUS ABSORPTION EFFECTS IN DIFFUSE SCATTERING OF ELECTRONS [J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1971, A 27 (MAR1) : 166 - &

[8] HART M, 1962, PHYS REV LETT, V7, P120

[9] ON PRODUCTION OF X-RAYS IN THIN METAL FOILS [J]. PHILOSOPHICAL MAGAZINE, 1962, 7 (84): : 2095 - &

[10] Howie A., 1970, Modern diffraction and imaging techniques in material science, P295

[1] Andersen J. U., 1971, Radiation Effects, V7, P25, DOI 10.1080/00337577108232561

[2] DETECTION OF FOREIGN ATOM SITES BY THEIR X-RAY FLUORESCENCE SCATTERING [J]. PHYSICAL REVIEW LETTERS, 1969, 22 (14) : 703 - +

[3] DIRECT DETERMINATION OF X-RAY REFLECTION PHASES [J]. PHYSICAL REVIEW LETTERS, 1982, 48 (03) : 163 - 166

[4] CHERNS D, 1973, Z NATURFORSCH A, VA 28, P565

[5] COSTER D, 1930, Z PHYS, V53, P345

[6] ENHANCED X-RAY EMISSION FROM EXTINCTION CONTOURS IN A SINGLE-CRYSTAL GOLD FILM [J]. PHILOSOPHICAL MAGAZINE, 1962, 7 (84): : 2101 - &

[7] STRUCTURE INFORMATION FROM ANOMALOUS ABSORPTION EFFECTS IN DIFFUSE SCATTERING OF ELECTRONS [J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1971, A 27 (MAR1) : 166 - &

[8] HART M, 1962, PHYS REV LETT, V7, P120

[9] ON PRODUCTION OF X-RAYS IN THIN METAL FOILS [J]. PHILOSOPHICAL MAGAZINE, 1962, 7 (84): : 2095 - &

[10] Howie A., 1970, Modern diffraction and imaging techniques in material science, P295