共 12 条
[2]
BECKMANP, 1963, SCATTERING ELECTROMA
[3]
BROADMANN R, 1988, P SOC PHOTO-OPT INS, V1009, P111
[5]
SURFACE-ROUGHNESS MEASUREMENTS WITH AN OPTICAL FOURIER SPECTRUM ANALYZER
[J].
APPLIED OPTICS,
1979, 18 (06)
:796-801
[6]
THE USE OF BESSEL-FUNCTIONS TO EXTEND THE RANGE OF OPTICAL DIFFRACTION TECHNIQUES FOR IN-PROCESS SURFACE FINISH MEASUREMENTS OF HIGH-PRECISION TURNED PARTS
[J].
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS,
1986, 19 (01)
:76-79
[8]
THWAITE EG, 1979, WEAR, V57, P70
[9]
THWAITE EG, 1982, ANN CIRP, V31, P463
[10]
THWAITE EG, 1980, ANN CIRP, V29, P419