CIRCULARLY-POLARIZED LIGHT-INDUCED DICHROISM IN PHOTOELECTRON DIFFRACTION OBSERVED WITH DISPLAY-TYPE SPHERICAL MIRROR ANALYZER

被引:14
作者
DAIMON, H [1 ]
NAKATANI, T [1 ]
IMADA, S [1 ]
SUGA, S [1 ]
KAGOSHIMA, Y [1 ]
MIYAHARA, T [1 ]
机构
[1] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN
关键词
D O I
10.1063/1.1145893
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Strong circular dichroism in two-dimensional photoelectron diffraction patterns was observed for the photoelectron from the Si 2p core on the Si(001) surface using a display-type spherical mirror analyzer, although this Si(001) surface has no chirality and magnetism. The forward focusing peaks in the pattern rotate clockwise or counterclockwise when the helicity of the incident circularly polarized light is reversed. This phenomenon offers a new possibility to measure the polarization of the circularly polarized light in situ because the asymmetry is large (about 25%) and clear. © 1995 American Institute of Physics.
引用
收藏
页码:1510 / 1512
页数:3
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