PHYSICAL-PROPERTIES OF BI4TI3O12 FILMS GROWN ON SI(100) WAFERS

被引:12
作者
YAMAGUCHI, M
NAGATOMO, T
OMOTO, O
机构
[1] Department of Electronics Engineering, Shibaura Institute of Technology, Minato-ku, 108
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1995年 / 34卷 / 9B期
关键词
THIN FILMS; BI4TI3O12; RF PLANAR MAGNETRON SPUTTERING; C-AXIS ORIENTATION; THICKNESS DEPENDENCE;
D O I
10.1143/JJAP.34.5116
中图分类号
O59 [应用物理学];
学科分类号
摘要
Bismuth titanate (Bi4Ti3O12) films were prepared on Si(100) wafers by rf planar magnetron sputtering using a target of Bi2TiO5 ceramic. C-axis-oriented Bi4Ti3O12 films were grown on Si(100) at a law substrate temperature of 550 degrees C. However, these films did not exhibit ferroelectricity, and the dielectric constant epsilon(r) and dissipation factor tan delta were about 156 and 0.032, respectively. The dielectric constant was reduced with decreasing film thickness. This behavior was assuming supposing a low-dielectric-constant interface layer. These films showeded the dielectric breakdown field of about 21 kV/cm.
引用
收藏
页码:5116 / 5119
页数:4
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