A METHOD FOR OBTAINING OUT-OF-PLANE DISPLACEMENTS BY MOIRE INTERFEROMETRY

被引：5

作者：

PATORSKI, K

机构：

[1] Warsaw Technical Univ, Warsaw, Pol, Warsaw Technical Univ, Warsaw, Pol

来源：

OPTICS COMMUNICATIONS | 1986年 / 60卷 / 03期

关键词：

D O I：

10.1016/0030-4018(86)90165-3

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：128 / 132

页数：5

共 11 条

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[7] PRODUCING AND TESTING BINARY AMPLITUDE GRATINGS USING A SELF-IMAGING AND DOUBLE-EXPOSURE TECHNIQUE [J].

PATORSKI, K ;

SZWAYKOWSKI, P .

OPTICS AND LASER TECHNOLOGY, 1983, 15 (06) :316-320

[8] OPTICAL DIFFERENTIATION OF DISPLACEMENT PATTERNS USING MOIRE INTERFEROMETRY [J].

PATORSKI, K ;

KUJAWINSKA, M .

APPLIED OPTICS, 1985, 24 (18) :3041-3048

[9] OPTICAL DIFFERENTIATION OF QUASI-PERIODIC PATTERNS USING TALBOT INTERFEROMETRY [J].

PATORSKI, K ;

SZWAYKOWSKI, P .

OPTICA ACTA, 1984, 31 (01) :23-31

[10] DEVELOPMENTS IN MOIRE INTERFEROMETRY [J].

POST, D .

OPTICAL ENGINEERING, 1982, 21 (03) :458-467

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