ON FINDING A NEARLY MINIMAL SET OF FAULT DETECTION TESTS FOR COMBINATIONAL LOGIC NETS

被引：139

作者：

ARMSTRONG, DB

机构：

来源：

IEEE TRANSACTIONS ON ELECTRONIC COMPUTERS | 1966年 / EC15卷 / 01期

关键词：

D O I：

10.1109/PGEC.1966.264376

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：66 / +

页数：1

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[2] TECHNIQUES FOR DIAGNOSIS OF SWITCHING CIRCUIT FAILURES
GALEY, JM
ROTH, JP
NORBY, RE
[J]. IEEE TRANSACTIONS ON COMMUNICATION AND ELECTRONICS, 1964, 83 (74): : 509 - &
[3] MARTELLOTTO NA, UNPUBLISHED
[4] MINIMIZATION OF BOOLEAN FUNCTIONS
MCCLUSKEY, EJ
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1956, 35 (06): : 1417 - 1444
[5] POAGE JF, 1963 P S MATH THEOR, P483
[6] ROTH J, TO BE PUBLISHED