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IMAGING OF MOS2 BY SCANNING TUNNELING MICROSCOPY
被引:60
作者
:
STUPIAN, GW
论文数:
0
引用数:
0
h-index:
0
STUPIAN, GW
LEUNG, MS
论文数:
0
引用数:
0
h-index:
0
LEUNG, MS
机构
:
来源
:
APPLIED PHYSICS LETTERS
|
1987年
/ 51卷
/ 19期
关键词
:
D O I
:
10.1063/1.98635
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:1560 / 1562
页数:3
相关论文
共 15 条
[1]
SYNCHROTRON RADIATION STUDY OF THE PHOTOIONIZATION CROSS-SECTIONS FOR THE WHOLE VALENCE BAND OF 2H-MOS2
ABBATI, I
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305
ABBATI, I
论文数:
引用数:
h-index:
机构:
BRAICOVICH, L
论文数:
引用数:
h-index:
机构:
CARBONE, C
论文数:
引用数:
h-index:
机构:
NOGAMI, J
LINDAU, I
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305
LINDAU, I
DELPENNINO, U
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305
DELPENNINO, U
[J].
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1986,
40
(04)
: 353
-
362
[2]
BANDO H, 1986, JPN J APPL PHYS, V26, pL41
[3]
SCANNING TUNNELING MICROSCOPY
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
[J].
SURFACE SCIENCE,
1985,
152
(APR)
: 17
-
26
[4]
IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE
BRYANT, A
论文数:
0
引用数:
0
h-index:
0
BRYANT, A
SMITH, DPE
论文数:
0
引用数:
0
h-index:
0
SMITH, DPE
QUATE, CF
论文数:
0
引用数:
0
h-index:
0
QUATE, CF
[J].
APPLIED PHYSICS LETTERS,
1986,
48
(13)
: 832
-
834
[5]
CHARGE-DENSITY WAVES OBSERVED WITH A TUNNELING MICROSCOPE
COLEMAN, RV
论文数:
0
引用数:
0
h-index:
0
COLEMAN, RV
DRAKE, B
论文数:
0
引用数:
0
h-index:
0
DRAKE, B
HANSMA, PK
论文数:
0
引用数:
0
h-index:
0
HANSMA, PK
SLOUGH, G
论文数:
0
引用数:
0
h-index:
0
SLOUGH, G
[J].
PHYSICAL REVIEW LETTERS,
1985,
55
(04)
: 394
-
397
[6]
FUNDAMENTAL-ASPECTS OF THE ELECTRONIC-STRUCTURE, MATERIALS PROPERTIES AND LUBRICATION PERFORMANCE OF SPUTTERED MOS2 FILMS
FLEISCHAUER, PD
论文数:
0
引用数:
0
h-index:
0
机构:
Chemistry and Physics Laboratory, The Aerospace Corporation, El Segundo, CA 90245, United States
FLEISCHAUER, PD
[J].
THIN SOLID FILMS,
1987,
154
(1-2)
: 309
-
322
[7]
SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE
GERBER, C
论文数:
0
引用数:
0
h-index:
0
GERBER, C
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
FUCHS, H
论文数:
0
引用数:
0
h-index:
0
FUCHS, H
MARTI, O
论文数:
0
引用数:
0
h-index:
0
MARTI, O
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1986,
57
(02)
: 221
-
224
[8]
SCANNING TUNNELING MICROSCOPY
HANSMA, PK
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
HANSMA, PK
TERSOFF, J
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TERSOFF, J
[J].
JOURNAL OF APPLIED PHYSICS,
1987,
61
(02)
: R1
-
R23
[9]
Hu Yong-jun, 1986, Acta Physica Sinica, V35, P50
[10]
KAISER W, COMMUNICATION
←
1
2
→
共 15 条
[1]
SYNCHROTRON RADIATION STUDY OF THE PHOTOIONIZATION CROSS-SECTIONS FOR THE WHOLE VALENCE BAND OF 2H-MOS2
ABBATI, I
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305
ABBATI, I
论文数:
引用数:
h-index:
机构:
BRAICOVICH, L
论文数:
引用数:
h-index:
机构:
CARBONE, C
论文数:
引用数:
h-index:
机构:
NOGAMI, J
LINDAU, I
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305
LINDAU, I
DELPENNINO, U
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305
DELPENNINO, U
[J].
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,
1986,
40
(04)
: 353
-
362
[2]
BANDO H, 1986, JPN J APPL PHYS, V26, pL41
[3]
SCANNING TUNNELING MICROSCOPY
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
[J].
SURFACE SCIENCE,
1985,
152
(APR)
: 17
-
26
[4]
IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE
BRYANT, A
论文数:
0
引用数:
0
h-index:
0
BRYANT, A
SMITH, DPE
论文数:
0
引用数:
0
h-index:
0
SMITH, DPE
QUATE, CF
论文数:
0
引用数:
0
h-index:
0
QUATE, CF
[J].
APPLIED PHYSICS LETTERS,
1986,
48
(13)
: 832
-
834
[5]
CHARGE-DENSITY WAVES OBSERVED WITH A TUNNELING MICROSCOPE
COLEMAN, RV
论文数:
0
引用数:
0
h-index:
0
COLEMAN, RV
DRAKE, B
论文数:
0
引用数:
0
h-index:
0
DRAKE, B
HANSMA, PK
论文数:
0
引用数:
0
h-index:
0
HANSMA, PK
SLOUGH, G
论文数:
0
引用数:
0
h-index:
0
SLOUGH, G
[J].
PHYSICAL REVIEW LETTERS,
1985,
55
(04)
: 394
-
397
[6]
FUNDAMENTAL-ASPECTS OF THE ELECTRONIC-STRUCTURE, MATERIALS PROPERTIES AND LUBRICATION PERFORMANCE OF SPUTTERED MOS2 FILMS
FLEISCHAUER, PD
论文数:
0
引用数:
0
h-index:
0
机构:
Chemistry and Physics Laboratory, The Aerospace Corporation, El Segundo, CA 90245, United States
FLEISCHAUER, PD
[J].
THIN SOLID FILMS,
1987,
154
(1-2)
: 309
-
322
[7]
SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE
GERBER, C
论文数:
0
引用数:
0
h-index:
0
GERBER, C
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
FUCHS, H
论文数:
0
引用数:
0
h-index:
0
FUCHS, H
MARTI, O
论文数:
0
引用数:
0
h-index:
0
MARTI, O
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1986,
57
(02)
: 221
-
224
[8]
SCANNING TUNNELING MICROSCOPY
HANSMA, PK
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
HANSMA, PK
TERSOFF, J
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TERSOFF, J
[J].
JOURNAL OF APPLIED PHYSICS,
1987,
61
(02)
: R1
-
R23
[9]
Hu Yong-jun, 1986, Acta Physica Sinica, V35, P50
[10]
KAISER W, COMMUNICATION
←
1
2
→