CRITICAL CURRENT-DENSITY AND RELATED MICROSTRUCTURE OF TEXTURED YBACUO RODS PRODUCED BY A MELT GROWTH-PROCESS

被引：15

作者：

GODELAINE, PA

HANNAY, C

CLOOTS, R

VANDERSCHUEREN, HW

TATLOCK, GJ

MCCARTNEY, DG

AUSLOOS, M

机构：

[1] UNIV LIEGE,INST PHYS,B-4000 LIEGE,BELGIUM

[2] UNIV LIVERPOOL,DEPT MAT SCI & ENGN,LIVERPOOL L69 3BX,ENGLAND

来源：

SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 1991年 / 4卷 / 12期

关键词：

D O I：

10.1088/0953-2048/4/12/001

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Textured YBaCuO rods have been grown using a moving thermal gradient method. Electrical resistivity and precise AC magnetic susceptibility data are presented for the samples. Fine structure in the imaginary part of the susceptibility plots is related to features of the microstructure. Following generalization of the Bean critical state model, we calculate the flux profile and penetration depth, and deduce the critical current density. We also give values for the activation energy in the flux creep model. It is shown that the critical current density increases logarithmically with frequency, as expected, but that care is needed when comparing values of J(c) obtained by different methods.

引用

页码：701 / 706

页数：6

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