HIGH-RESOLUTION EELS ON THE (100) SURFACE OF BETA-SIC

[1] DAYAN M, UNPUB

[2] A HIGH-RESOLUTION EELS STUDY OF FREE-CARRIER VARIATIONS IN H2+/H+ BOMBARDED (100)GAAS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1984, 2 (02): : 101 - 106

[3] SURFACE OPTICAL PHONONS AND HYDROGEN CHEMISORPTION ON POLAR AND NON-POLAR FACES OF GAAS, INP, AND GAP [J]. PHYSICAL REVIEW B, 1982, 26 (02): : 794 - 802

[4] FUCHS R, 1965, PHYS REV, V140, P2076

[5] OPTICAL SURFACE PHONONS IN ZINC OXIDE DETECTED BY SLOW-ELECTRON SPECTROSCOPY [J]. PHYSICAL REVIEW LETTERS, 1970, 24 (25) : 1416 - &

[6] KLIEWER KL, 1966, PHYS REV, V144, P495, DOI 10.1103/PhysRev.144.495

[7] MARSHALL RC, 1973, SILICON CARBIDE 1973

[8] MIRLIN DN, 1982, SURFACE POLARITONS, P3

[9] PRODUCTION OF LARGE-AREA SINGLE-CRYSTAL WAFERS OF CUBIC SIC FOR SEMICONDUCTOR-DEVICES [J]. APPLIED PHYSICS LETTERS, 1983, 42 (05) : 460 - 462

[10] RYAN CE, 1969, SILICON CARBIDE 1968, pS1

[1] DAYAN M, UNPUB

[2] A HIGH-RESOLUTION EELS STUDY OF FREE-CARRIER VARIATIONS IN H2+/H+ BOMBARDED (100)GAAS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1984, 2 (02): : 101 - 106

[3] SURFACE OPTICAL PHONONS AND HYDROGEN CHEMISORPTION ON POLAR AND NON-POLAR FACES OF GAAS, INP, AND GAP [J]. PHYSICAL REVIEW B, 1982, 26 (02): : 794 - 802

[4] FUCHS R, 1965, PHYS REV, V140, P2076

[5] OPTICAL SURFACE PHONONS IN ZINC OXIDE DETECTED BY SLOW-ELECTRON SPECTROSCOPY [J]. PHYSICAL REVIEW LETTERS, 1970, 24 (25) : 1416 - &

[6] KLIEWER KL, 1966, PHYS REV, V144, P495, DOI 10.1103/PhysRev.144.495

[7] MARSHALL RC, 1973, SILICON CARBIDE 1973

[8] MIRLIN DN, 1982, SURFACE POLARITONS, P3

[9] PRODUCTION OF LARGE-AREA SINGLE-CRYSTAL WAFERS OF CUBIC SIC FOR SEMICONDUCTOR-DEVICES [J]. APPLIED PHYSICS LETTERS, 1983, 42 (05) : 460 - 462

[10] RYAN CE, 1969, SILICON CARBIDE 1968, pS1