HREM INVESTIGATION OF (110) ORIENTED YBA2CU3O7 THIN-FILMS DEPOSITED ON (110) SRTIO3 SUBSTRATES

被引：16

作者：

SEO, JW

KABIUS, B

JIA, CL

SOLTNER, H

POPPE, U

URBAN, K

机构：

[1] FORSCHUNGSZENTRUM JULICH, FORSCHUNGSZENTRUM, INST FESTKORPERFORSCH, D-52425 JULICH, GERMANY

[2] FORSCHUNGSZENTRUM JULICH, FORSCHUNGSZENTRUM, INST SCHICHT & IONENTECH, D-52425 JULICH, GERMANY

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 1994年 / 225卷 / 1-2期

关键词：

D O I：

10.1016/0921-4534(94)90340-9

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The epitaxial growth and microstructure of YBa2Cu3O7 thin films on (110) SrTiO3 substrates was investigated by high-resolution electron microscopy. The single thin films and heterostructures with PrBa2Cu3O7 and SrTiO3 separating the superconductor layers were deposited by DC sputtering. All layers were grown with the [110] direction perpendicular to the substrate surface with the c-axis of the YBa2Cu3O7 film oriented parallel to the [001] direction of the substrate. Resistance measurements showed that, by applying a template growth procedure, T(c) values of up to 85 K can be obtained. Stacking faults were found to be the dominant defect type in the superconducting film. A structural model for a novel type of these defects inducing a local 2-3-5 cation stoichiometry was deduced by comparison between experimental and simulated high-resolution images. Antiphase boundaries with a habit plane close to the (110) plane of YBa2Cu3O7 were detected.

引用

页码：158 / 166

页数：9

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