Precision tests of quantum hall effect device DC equivalent circuit using double-series and triple-series connections

被引:22
作者
Jeffery, A
Elmquist, RE
Cage, ME
机构
关键词
ac quantum Hall effect; cryogenic current comparator; de quantum Hall effect; equivalent electrical circuit; quantized Hall resistance; two-dimensional electron gas;
D O I
10.6028/jres.100.050
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Precision tests verify the de equivalent circuit used by Ricketts and Kemeny to describe a quantum Hall effect device in terms of electrical circuit elements. The tests employ the use of cryogenic current comparators and the double-series and triple-series connection techniques of Delahaye. Verification of the dc equivalent circuit in double-series and triple-series connections is a necessary step in developing the ac quantum Hall effect as an intrinsic standard of resistance.
引用
收藏
页码:677 / 685
页数:9
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