BONDING WIRES TO QUANTIZED HALL RESISTORS

被引:4
作者
LEE, KC
机构
[1] National Institute of Standards and Technology, Technology Administration, U.S. Department of Commerce, Gaithersburg
关键词
D O I
10.1109/19.377823
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Three different techniques for attaching wires to quantized Hall resistors with gold-germanium-nickel (AuGe/Ni) alloyed contacts were evaluated. The best quality and most robust samples were made by evaporating bonding pads that overlapped the alloyed contacts and the substrate, so that bonds could be made over the substrate rather than over the heterostructure.
引用
收藏
页码:249 / 253
页数:5
相关论文
共 9 条
[1]  
BRAUN JD, 1963, T ASM, V56, P870
[2]  
HARMAN GG, 1989, RELIABILITY YIELD PR, P159
[3]   DEGRADATION OF A GUNN DIODE BY DISLOCATIONS INDUCED DURING THERMOCOMPRESSION BONDING [J].
HASEGAWA, F ;
ITO, H .
APPLIED PHYSICS LETTERS, 1972, 21 (03) :107-&
[4]  
JANCO BL, 1973, METALLOGRAPHIC REV, V2, P16
[5]   PROPERTIES OF ALLOYED AUGENI-CONTACTS ON GAAS/GAALAS-HETEROSTRUCTURES [J].
JUCKNISCHKE, D ;
BUHLMANN, HJ ;
HOUDRE, R ;
ILEGEMS, M ;
PY, MA ;
JECKELMANN, B ;
SCHWITZ, W .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1991, 40 (02) :228-230
[6]  
KHAN MM, 1987, IEEE T CHMT, V12, P586
[7]   REPORT ON A JOINT BIPM-EUROMET PROJECT FOR THE FABRICATION OF QHE SAMPLES BY THE LEP [J].
PIQUEMAL, F ;
GENEVES, G ;
DELAHAYE, F ;
ANDRE, JP ;
PATILLON, JN ;
FRIJLINK, P .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1993, 42 (02) :264-268
[8]   THIN-FILM INTERDIFFUSION OF AU AND IN AT ROOM-TEMPERATURE [J].
SIMIC, V ;
MARINKOVIC, Z .
THIN SOLID FILMS, 1977, 41 (01) :57-61
[9]  
Vidano R. P., 1987, IEEE T COMPON HYBR, V12, P612