ASYMMETRIC INTERFACE ROUGHNESS IN SEMICONDUCTORS GROWN BY MOLECULAR-BEAM EPITAXY

被引:8
作者
DUDLEY, S [1 ]
SINGH, J [1 ]
BAJAJ, KK [1 ]
机构
[1] UNIV MICHIGAN,DEPT ELECT ENGN & COMP SCI,ANN ARBOR,MI 48109
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1987年 / 5卷 / 03期
关键词
D O I
10.1116/1.583768
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:712 / 715
页数:4
相关论文
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[6]   A STUDY OF NOVEL GROWTH APPROACHES TO INFLUENCE THE GROWTH-MECHANISM AND INTERFACE QUALITY IN HETEROSTRUCTURES GROWN BY MOLECULAR-BEAM EPITAXY [J].
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